Topological marker in three dimensions based on kernel polynomial method

Authors

Ranadeep Roy, Wei Chen

Categories

Abstract

The atomic-scale influence of disorder on the topological order can be quantified by a universal topological marker, although the practical calculation of the marker becomes numerically very costly in higher dimensions. We propose that for any symmetry class in higher dimensions, the topological marker can be calculated in a very efficient way by adopting the kernel polynomial method. Using class AII in three dimensions as an example, which is relevant to realistic topological insulators like Bi2Se3 and Bi2Te3, this method reveals the criteria for the invariance of topological order in the presence of disorder, as well as the possibility of a smooth cross over between two topological phases caused by disorder. In addition, the significantly enlarged system size in the numerical calculation implies that this method is capable of capturing the quantum criticality much closer to topological phase transitions, as demonstrated by a nonlocal topological marker.